Smoltek increases development speed with new zapping method
This press release is an English version of the previously published Swedish version, which has interpretive precedence.
Smoltek Nanotech Holding AB (publ) (“Smoltek” or “the Company”) announces that group company Smoltek Semi has developed a new process, called zapping, which reduces the number of steps required to manufacture test capacitors. This shortens the time to manufacture test capacitors from nearly a month to just one week. The faster manufacturing process allows the researchers to conduct more experiments that accelerate major technology advances – such as tripling the capacitance density and halving the leakage current – making the CNF-MIM technology even more attractive to potential buyers.
“By cutting the development time so dramatically, we can iterate faster and focus more on optimizing performance. This efficiency allows us to explore new configurations and achieve breakthroughs much sooner, which strengthens our position when engaging with potential buyers”, Farzan Ghavanini, CTO of Smoltek says.
The new method, called zapping, is exclusively used during the development phase to expedite testing. It enables researchers to quickly evaluate new configurations and materials using simplified test capacitors, saving valuable time and resources.
“Zapping is a clear benefit for us and our shareholders. Faster development cycles mean shorter time to market for breakthroughs, such as tripling capacitance density and halving leakage current,” Farzan adds.
Zapping, explained:
The zapping method involves briefly applying a high voltage across specific contact points on a test capacitor, creating a controlled breakdown in the insulating layer. This technique eliminates the need for multiple complex etching steps, significantly streamlining the testing process.
For a more detailed explanation of the zapping method and its impact on Smoltek's capacitor technology development, please visit the company's IR blog.
